DocumentCode :
773760
Title :
Modification of surface energy, dry etching, and organic film removal using atmospheric-pressure pulsed-corona plasma
Author :
Yamamoto, Toshiaki ; Newsome, J. Raandall ; Ensor, David S.
Author_Institution :
Res. Triangle Inst., Research Triangle Park, NC, USA
Volume :
31
Issue :
3
fYear :
1995
Firstpage :
494
Lastpage :
499
Abstract :
A laboratory-scale atmospheric-pressure plasma reactor, using a nanosecond pulsed corona, was constructed to demonstrate potential applications ranging from modification of surface energy to removal of surface organic films. For surface modification studies, three different substrates were selected to evaluate the surface energies: bare aluminum, polyurethane, and silicon coated with photoresist. The critical surface energy for all materials studied significantly increased after the plasma treatment. The effects of gas composition and plasma treatment time were also investigated. Photoresist, ethylene glycol, and Micro surfactant were used as test organic films. The etching rate of a photoresist coating on silicon was 9 nm/min. Organic film removal using atmospheric pressure plasma technology was shown to be feasible
Keywords :
corona; etching; organic compounds; photoresists; surface energy; surface energy measurement; surface treatment; Al; Micro surfactant; Si; atmospheric-pressure pulsed-corona plasma; bare aluminum; dry etching; ethylene glycol; gas composition; nanosecond pulsed corona; organic film removal; photoresist; plasma treatment; polyurethane; silicon; substrates; surface energy modification; Atmospheric-pressure plasmas; Corona; Dry etching; Inductors; Laboratories; Plasma applications; Plasma materials processing; Resists; Silicon; Surface treatment;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.382108
Filename :
382108
Link To Document :
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