Title :
Real-Time Constrained Energy Minimization for Subpixel Detection
Author :
Chein-I Chang ; Hsiao-Chi Li ; Meiping Song ; Chunhong Liu ; Lifu Zhang
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Univ. of Maryland, Baltimore, MD, USA
Abstract :
Constrained energy minimization (CEM) has been widely used in subpixel detection. This paper presents a new real-time processing of CEM according to two data acquisition formats, band-interleaved-pixel/sample (BIP/BIS) and band-interleaved line (BIL) where the global sample correlation matrix R must be replaced with a causal sample correlation matrix formed by only those data samples up to the pixel/sample currently being processed or a causal data line matrix formed by all data lines up to the data line being just completed. Both versions of CEM have not been investigated in the past. Its applications include detection of moving targets which can be only detected in real-time ongoing process, as well as subtle targets which is likely to be missed and overwhelmed by CEM in one-shot operation. Interestingly, while BIP/BIS and BIL look similar, their real-time implementations are quite different due to their use of causal sample correlation matrices, one updated by samples and the other updated by data lines. As a result, two different recursive equations are also derived for CEM using BIP/BIS and BIL, respectively, for real-time implementation.
Keywords :
correlation methods; data acquisition; matrix algebra; minimisation; object detection; BIL; BIP-BIS; CEM; band-interleaved line; band-interleaved-pixel-sample; correlation matrix; data acquisition format; data line matrix; real-time constrained energy minimization; subpixel detection; Correlation; Earth; Hyperspectral imaging; Mathematical model; Minimization; Real-time systems; Constrained energy minimization (CEM); RT-CEM using band-interleaved line (BIL); RT-CEM using band-interleaved-pixel/sample (BIP/BIS); real-time constrained energy minimization (RT-CEM); subpixel detection;
Journal_Title :
Selected Topics in Applied Earth Observations and Remote Sensing, IEEE Journal of
DOI :
10.1109/JSTARS.2015.2425417