• DocumentCode
    773960
  • Title

    A New Simulation-Based Property Checking Algorithm Based on Partitioned Alternative Search Space Traversal

  • Author

    Wu, Qingwei ; Hsiao, Michael S.

  • Author_Institution
    Cadence Design Syst. Inc., San Jose, CA
  • Volume
    55
  • Issue
    11
  • fYear
    2006
  • Firstpage
    1325
  • Lastpage
    1334
  • Abstract
    We present a new logic-simulation-based algorithm on verifying safety properties of large sequential hardware designs. This algorithm explores the search space defined by partitioned internal circuit nodes. Two powerful features are proposed to increase the effectiveness during search space exploration and counterexample generation for verifying safety properties. These include 1) new search space constituted by internal nodes instead of state variables and 2) static learning on multiple nodes to further enlarge the target. These two features are integrated with the following techniques during our simulation: incorporation of a BCP (Boolean constraint propagation) engine for multiple nodes implication and multiple-time-frame GA (genetic algorithm) search. Because only logic simulation is needed in our algorithm, the computational effort is low. Experimental results on large benchmark circuits have shown that this logic-simulation-based verifier achieves significantly better results compared with existing formal verification tools and simulation-based methods
  • Keywords
    constraint handling; formal verification; genetic algorithms; logic circuits; logic design; logic simulation; logic testing; Boolean constraint propagation engine; genetic algorithm search; large sequential hardware designs; multiple node implication; multiple-time-frame GA; new logic-simulation-based property checking algorithm; partitioned alternative search space traversal; partitioned internal circuit nodes; static learning; Algorithm design and analysis; Business continuity; Circuit simulation; Computational modeling; Engines; Hardware; Partitioning algorithms; Power generation; Safety; Space exploration; Automatic test pattern generation (ATPG); logic-simulation; satisfiability.; verification;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2006.170
  • Filename
    1705442