Title :
Measurement of optical nonlinearity in silicon rich nitride waveguide ring resonators
Author :
Philipp, H.T. ; Svendsen, W. ; Andersen, K.N. ; Hübner, J. ; Povlsen, J. Hedegaard
Author_Institution :
Tech. Univ. of Denmark, Lyngby, Denmark
Abstract :
The optical nonlinearities of amorphous silicon rich nitride corresponding to χ(3) in a static electric field have been measured by tracking wavelength shifts in the resonances of optical waveguide ring resonators as a function of an applied electrical field. The magnitude of the nonlinearity measured agrees well with expected values.
Keywords :
nonlinear optical susceptibility; optical resonators; optical waveguides; silicon compounds; SiN; amorphous silicon rich nitride; electric field; optical nonlinearity; optical waveguide ring resonator; third-order susceptibility;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030771
