• DocumentCode
    774012
  • Title

    Measurement of optical nonlinearity in silicon rich nitride waveguide ring resonators

  • Author

    Philipp, H.T. ; Svendsen, W. ; Andersen, K.N. ; Hübner, J. ; Povlsen, J. Hedegaard

  • Author_Institution
    Tech. Univ. of Denmark, Lyngby, Denmark
  • Volume
    39
  • Issue
    16
  • fYear
    2003
  • Firstpage
    1184
  • Lastpage
    1185
  • Abstract
    The optical nonlinearities of amorphous silicon rich nitride corresponding to χ(3) in a static electric field have been measured by tracking wavelength shifts in the resonances of optical waveguide ring resonators as a function of an applied electrical field. The magnitude of the nonlinearity measured agrees well with expected values.
  • Keywords
    nonlinear optical susceptibility; optical resonators; optical waveguides; silicon compounds; SiN; amorphous silicon rich nitride; electric field; optical nonlinearity; optical waveguide ring resonator; third-order susceptibility;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20030771
  • Filename
    1226570
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=774012