Title :
Progress in the Application of Semiconductor Detectors to Nuclear Physics Experiments
Author_Institution :
Electronics Division Argonne National Laboratory Argonne, Illinois
fDate :
4/1/1965 12:00:00 AM
Keywords :
Cooling; Germanium; Nuclear physics; Radiation detectors; Semiconductor diodes; Silicon; Surface contamination; Thickness measurement; X-ray detection; X-ray detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1965.4323571