Title :
A novel high-speed silicon MSM photodetector operating at 830 nm wavelength
Author :
Lee, Hee Chul ; Van Zeghbroeck, B.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
fDate :
5/1/1995 12:00:00 AM
Abstract :
A novel high-speed silicon photodetector that operates at a wavelength of 830 nm is reported. It consists of a Metal-Semiconductor-Metal (MSM) detector that is fabricated on a 5-μm thick silicon membrane. The detector has a measured -3 dB bandwidth of 3 GHz at 10 V, which is almost one order of magnitude larger than the reported bandwidth of conventional silicon MSM detectors as measured at 830 nm. The DC responsivity is 0.17 A/W, corresponding to an internal quantum efficiency of 60.5% and an external quantum efficiency of 25.4%. The large bandwidth and good responsivity at the wavelength of interest, combined with its low operating voltage and compatibility with most silicon integrated circuit technologies, make this detector a promising candidate for monolithic optoelectronic receiver circuits for use in short distance optical communication systems and computer interconnects.
Keywords :
elemental semiconductors; integrated optoelectronics; metal-semiconductor-metal structures; optical receivers; photodetectors; silicon; 10 V; 25.4 percent; 3 GHz; 60.5 percent; 830 nm; DC responsivity; Si; Si membrane; computer interconnects; high-speed MSM photodetector; monolithic optoelectronic receiver circuits; quantum efficiency; short distance optical communication systems; wideband operation; Bandwidth; Biomembranes; Detectors; Integrated circuit measurements; Integrated circuit technology; Low voltage; Optical receivers; Photodetectors; Silicon; Wavelength measurement;
Journal_Title :
Electron Device Letters, IEEE