DocumentCode
776223
Title
Investigation of plasma sprayed coatings formation by visualization of droplet impact and splashing on a smooth substrate
Author
Cedelle, J. ; Vardelle, M. ; Pateyron, B. ; Fauchais, P.
Author_Institution
SPCTS Lab., Univ. of Limoges, France
Volume
33
Issue
2
fYear
2005
fDate
4/1/2005 12:00:00 AM
Firstpage
414
Lastpage
415
Abstract
In plasma spraying, individual droplet behavior at impact with the substrate is the fundamental element in understanding of coating microstructure. A new experimental setup with two fast shutter cameras (exposure time: 100 ns...1 ms) provides visualization at impact of a single particle, plasma sprayed with a direct current (dc) torch. Images of plasma-sprayed particles at impact on a smooth substrate are presented. The resultant splashing phenomena can be resolved into two parts: the initial impact and particle flattening response. Matter ejection due to the impact is independent of the substrate temperature but this is not the case for flattening splashing. Image correlation with recorded test parameters signals, transistor-transistor logic (TTL) pulse for cameras triggering, pyrometer signal, enable the events chronology, which is essential for the understanding the complete phenomena, to be studied.
Keywords
plasma arc sprayed coatings; plasma arc spraying; plasma torches; coating microstructure; direct current torch; droplet impact visualization; droplet splashing visualization; fast shutter camera; flattening splashing; image correlation; matter ejection; particle flattening response; plasma sprayed coatings formation; plasma spraying; plasma-sprayed particles; pyrometer signal; smooth substrate; substrate temperature; transistor-transistor logic pulse; Cameras; Coatings; Logic testing; Plasma properties; Plasma temperature; Pulse measurements; Steel; Thermal spraying; Velocity measurement; Visualization; Droplets impact; imaging technique; plasma spraying; splashing processes;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2005.845121
Filename
1420503
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