• DocumentCode
    776631
  • Title

    Closed-Loop Nonlinear Modeling of Wideband \\Sigma \\Delta Fractional- N Frequency Synthesizers

  • Author

    Hedayati, Hiva ; Bakkaloglu, Bertan ; Khalil, Waleed

  • Author_Institution
    Arizona State Univ., Tempe, AZ
  • Volume
    54
  • Issue
    10
  • fYear
    2006
  • Firstpage
    3654
  • Lastpage
    3663
  • Abstract
    Wideband low-noise SigmaDelta fractional-N synthesizers pose several design challenges due to the nonlinear time-varying nature of synthesizer building blocks such as phase frequency detectors (PFDs), charge pump, and frequency dividers. Loop nonlinearities can increase close-in phase noise and enhance spurious tones due to intermodulation of high-frequency quantization noise and tonal content; therefore, an accurate simulation model is critical for successful implementation of loop parameters and bandwidth widening techniques. In this paper a closed-loop nonlinear simulation model for fractional-N synthesizers is presented. Inherent nonuniform sampling of the PFD is modeled through an event-driven dual-iteration-based technique. The proposed technique generates a vector of piecewise linear time-voltage pairs, defining the voltage-controlled oscillator (VCO) control voltage. This method also lends itself to modeling of cyclostationary thermal and flicker noise generated by time-varying charge-pump current pulses. A flexible third-order SigmaDelta modulated RF synthesizer core with integrated loop filter and LC-tank VCO is designed and fabricated in 0.13-mum CMOS process in order to validate the technique experimentally. The proposed modeling technique was able to predict in-band spur power levels with 1.8-dB accuracy, and spur frequency offsets with lower than 400-Hz accuracy with several programmable nonidealities enabled
  • Keywords
    delta-sigma modulation; flicker noise; frequency synthesizers; intermodulation distortion; phase noise; piecewise linear techniques; quantisation (signal); thermal noise; voltage-controlled oscillators; 0.13 micron; CMOS process; charge pump; closed-loop modeling; dual-iteration technique; flicker noise; fractional-n frequency synthesizers; frequency dividers; integrated loop filter; intermodulation distortion; loop parameters; nonlinear modeling; nonuniform sampling; phase frequency detectors; phase noise; phase-locked loops; quantization noise; sigma-delta modulation; spur frequency offsets; spurious tones; thermal noise; voltage-controlled oscillator; Charge pumps; Delta-sigma modulation; Frequency conversion; Frequency synthesizers; Phase frequency detector; Phase noise; Quantization; Semiconductor device modeling; Voltage-controlled oscillators; Wideband; Fractional-; phase noise; phase-locked loops (PLLs); quantization noise; sigma–delta modulation; spurs;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2006.882872
  • Filename
    1705684