Title :
A low-power charge-recycling ROM architecture
Author :
Yang, Byung-Do ; Kim, Lee-Sup
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Abstract :
This paper describes a newly proposed low-power charge-recycling read-only memory (CR-ROM) architecture. The CR-ROM reduces the power consumption in bit lines, word lines, and precharge lines by recycling the previously used charge. In the proposed CR-ROM, bit-line swing voltage is lowered by the charge recycling between bit lines. When N bit lines recycle their charges, the swing voltage and the power of the bit lines become 1/N and 1/N/sup 2/ compared to the conventional ROMs, respectively. As the number of N increases, the power saving in bit lines becomes salient. Also, power consumption in word lines and precharge lines can be reduced theoretically to half by the proposed charge-recycling techniques. The simulation results show that the CR-ROM consumes 60%/spl sim/85% of the conventional low-power ROMs with 1 K /spl times/ 32 b. A CR-ROM with 32 Kb was implemented in a 0.35-/spl mu/m CMOS process. The power dissipation is 6.60 mW at 100 MHz with 3.3 V and the maximum operating clock frequency is 150 MHz.
Keywords :
CMOS memory circuits; VLSI; low-power electronics; memory architecture; read-only storage; 0.35 micron; 100 MHz; 150 MHz; 3.3 V; 32 Kbit; 6.60 mW; CR-ROM; bit lines; bit-line swing voltage; charge-recycling ROM architecture; low-power ROMs; low-power architecture; maximum operating clock frequency; power consumption; power dissipation; precharge lines; word lines; CMOS process; Capacitance; Clocks; Energy consumption; Memory architecture; Power dissipation; Read only memory; Recycling; Very large scale integration; Voltage;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2003.816138