DocumentCode :
776842
Title :
Low-leakage asymmetric-cell SRAM
Author :
Azizi, Navid ; Najm, Farid N. ; Moshovos, Andreas
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Toronto, Ont., Canada
Volume :
11
Issue :
4
fYear :
2003
Firstpage :
701
Lastpage :
715
Abstract :
We introduce a novel family of asymmetric dual-V/sub t/ static random access memory cell designs that reduce leakage power in caches while maintaining low access latency. Our designs exploit the strong bias toward zero at the bit level exhibited by the memory value stream of ordinary programs. Compared to conventional symmetric high-performance cells, our cells offer significant leakage reduction in the zero state and, in some cases, also in the one state, albeit to a lesser extent. A novel sense amplifier, in combination with dummy bitlines, allows for read times to be on par with conventional symmetric cells. With one cell design, leakage is reduced by 7/spl times/ (in the zero state) with no performance degradation, but with a stability degradation of 6%. Another cell design reduces leakage by 2/spl times/ (in the zero state) with no performance or stability loss. An alternative cell design reduces leakage by 58/spl times/ (in the zero state) with a performance degradation of 1% and an area increase of 2.4% and no stability degradation.
Keywords :
SRAM chips; cache storage; circuit stability; leakage currents; access latency; asymmetric-cell SRAM; caches; dummy bitlines; leakage power; leakage reduction; memory value stream; performance degradation; read times; sense amplifier; stability degradation; Degradation; Delay; Leakage current; MOSFETs; Power dissipation; Random access memory; SRAM chips; Stability; System-on-a-chip; Threshold voltage;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2003.816139
Filename :
1229876
Link To Document :
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