• DocumentCode
    776901
  • Title

    A 150 K channelless gate array design in 0.5-μm CMOS technology

  • Author

    Anderson, Floyd E. ; Ford, Jenny M.

  • Author_Institution
    Motorola Semicond. Res. & Dev. Lab., Phoenix, AZ, USA
  • Volume
    23
  • Issue
    2
  • fYear
    1988
  • fDate
    4/1/1988 12:00:00 AM
  • Firstpage
    520
  • Lastpage
    522
  • Abstract
    The chip presented was designed as a vehicle to investigate the advantages and tradeoffs of using 0.5-μm technology for semicustom VLSI devices. The use of 0.5-μm technology requires that a 3.3-V supply be used. Several architectures were investigated for maximum efficiency and ease of use with place and route software, keeping in mind tradeoffs between routability, performance, and density. The problem of providing an adequate power distribution system that did not hinder array efficiency was addressed, and the provision of high-speed high-integrity clock signals to provide system speeds up to 100 MHz was a major consideration. The unique core cell, designed for this array to fully utilize the advantages of the technology, is discussed. System considerations such as synchronous data operations and testability were met by the inclusion of level-sensitive set-scan registers as an integral part of the I/O. Results highlight the observation that system performance is often limited by the device and interconnect parasitics, which have become increasingly more dominant with smaller geometries
  • Keywords
    CMOS integrated circuits; VLSI; integrated logic circuits; 100 MHz; 150 K gate arrays; 3.3 V; 500 nm; CMOS technology; array efficiency; channelless gate array; core cell; density; device parasitics; high-speed high-integrity clock signals; interconnect parasitics; level-sensitive set-scan registers; performance; place and route software; power distribution system; routability; sea of gates; semicustom VLSI devices; smaller geometries; synchronous data operations; system performance; system speeds; testability; tradeoffs; CMOS technology; Clocks; Computer architecture; Geometry; Power distribution; Software performance; System performance; System testing; Vehicles; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.1016
  • Filename
    1016