• DocumentCode
    776903
  • Title

    A unified approach for fault tolerance and dynamic power management in fixed-priority real-time embedded systems

  • Author

    Zhang, Ying ; Chakrabarty, Krishnendu

  • Author_Institution
    Guidant Corp., St. Paul, MN, USA
  • Volume
    25
  • Issue
    1
  • fYear
    2006
  • Firstpage
    111
  • Lastpage
    125
  • Abstract
    This paper investigates an integrated approach for achieving fault tolerance and energy savings in real-time embedded systems. Fault tolerance is achieved via checkpointing, and energy is saved using dynamic voltage scaling (DVS). The authors present a feasibility analysis for checkpointing schemes for a constant processor speed as well as for variable processor speeds. DVS is then carried out on the basis of the feasibility analysis. The authors incorporate important practical issues such as faults during checkpointing, rollback recovery time, memory access time, and energy needed for checkpointing, as well as DVS and context switching overhead. Numerical results based on real-life checkpointing data and processor data sheets show that compared to fault-oblivious methods, the proposed approach significantly reduces power consumption and guarantees timely task completion in the presence of faults.
  • Keywords
    checkpointing; embedded systems; fault tolerant computing; microprocessor chips; checkpointing schemes; constant processor speed; dynamic power management; dynamic voltage scaling; fault tolerance; fault-oblivious methods; power consumption; processor data sheet; real-life checkpointing data sheet; real-time embedded systems; variable processor speed; Checkpointing; Dynamic voltage scaling; Embedded system; Energy consumption; Energy management; Fault tolerance; Fault tolerant systems; Power system management; Real time systems; Voltage control; Checkpointing; dynamic voltage scaling (DVS); fault tolerance; real-time scheduling;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.852657
  • Filename
    1564308