Perturbation of dielectric resonator for material measurement

Author

Shu, Y. ; Wong, T.Y.

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA

Volume

31

Issue

9

fYear

1995

fDate

4/27/1995 12:00:00 AM

Firstpage

704

Lastpage

705

Abstract

A novel method for rapid measurement of the permittivity of a small object has been developed. Based on the perturbation of a semi-open resonant structure with a dielectric resonator excited in the TE₀₁₁ mode, the apparatus allows samples to be introduced freely and exhibits substantial mode stability. Results of permittivity measurement on low-loss dielectric samples in the form of thin plates and disks were in good agreement with values given by alternative methods employing much larger samples. The method can be extended to account for dielectric loss and permeability. In addition to being applied to material characterisation in the laboratory, the resonant structure can be developed into a transportable dielectrometer for small objects

Keywords

dielectric loss measurement; dielectric resonators; permittivity measurement; perturbation techniques; stability; TE₀₁₁ mode excitation; dielectric loss; dielectric resonator perturbation; low-loss dielectric samples; material characterisation; material measurement; mode stability; permeability; permittivity measurement; semi-open resonant structure; small objects; thin disks; thin plates; transportable dielectrometer;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:19950511

Filename

384057