• DocumentCode
    777225
  • Title

    Finite-difference time-domain model of interfaces with metals and semiconductors based on a higher order surface impedance boundary condition

  • Author

    Kärkkäinen, Mikko K. ; Tretyakov, Sergei A.

  • Author_Institution
    Dept. of Electr. & Commun. Eng., Helsinki Univ. of Technol., Finland
  • Volume
    51
  • Issue
    9
  • fYear
    2003
  • fDate
    9/1/2003 12:00:00 AM
  • Firstpage
    2448
  • Lastpage
    2455
  • Abstract
    A new numerical finite-difference time-domain (FDTD) model of interfaces with metals and semiconductors is developed. The model uses a higher order impedance boundary condition to simulate the fields in conductive media. The approach has been found to be considerably more accurate than the known models based on the simple Leontovich impedance boundary condition. This is because the new model takes the incidence angle of the incident waves into account, and it is valid for all values of conductivity. The derivation of the method is presented in the two-dimensional (2D) case, and the performance is studied over a wide range of conductivity. The validation of the method is made by comparing with the exact results in a 2D example problem. The proposed method is also compared with some other methods available in the literature.
  • Keywords
    electrical conductivity; finite difference time-domain analysis; semiconductor-metal boundaries; surface impedance; 2D case; FDTD model; conductive media; conductivity; field simulation; finite-difference time-domain model; higher order impedance boundary condition; incidence angle; metal semiconductor interfaces; performance; recursive convolution techniques; surface impedance boundary condition; two-dimensional case; Boundary conditions; Conducting materials; Conductivity; Conductors; Convolution; Finite difference methods; Space technology; Surface impedance; Time domain analysis; Two dimensional displays;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2003.816340
  • Filename
    1229914