Amplified spontaneous emission spectroscopy in strained quantum-well lasers

Amplified spontaneous emission spectroscopy is used to extract the gain and refractive index spectra systematically. We obtain the gain and differential gain spectra using the Hakki-Paoli method. The refractive index profile, the induced change in refractive index by an incremental current, and the linewidth enhancement factor are measured from the Fabry-Perot peaks and the current-induced peak shifts in the amplified spontaneous emission spectra. The measured optical gain and refractive index are then compared with our theoretical model for strained quantum-well lasers. We show that a complete theoretical model for calculating the electronic band structure, the optical constant, and the linewidth enhancement factor agrees very well with the experiment. Our approach demonstrates that amplified spontaneous emission spectroscopy can be a good diagnostic tool to characterize laser diodes, extract the optical gain and index profiles, and confirm material parameters such as the strained quantum-well band structure parameters for a semiconductor structure under carrier injection