• DocumentCode
    777477
  • Title

    A 146-mm2 8-gb multi-level NAND flash memory with 70-nm CMOS technology

  • Author

    Hara, Takahiko ; Fukuda, Koichi ; Kanazawa, Kazuhisa ; Shibata, Noboru ; Hosono, Koji ; Maejima, Hiroshi ; Nakagawa, Michio ; Abe, Takumi ; Kojima, Masatsugu ; Fujiu, Masaki ; Takeuchi, Yoshiaki ; Amemiya, Kazumi ; Morooka, Midori ; Kamei, Teruhiko ; Nasu

  • Author_Institution
    SoC R&D Center, Toshiba Corp. Semicond. Co., Kanagawa, Japan
  • Volume
    41
  • Issue
    1
  • fYear
    2006
  • Firstpage
    161
  • Lastpage
    169
  • Abstract
    An 8-Gb multi-level NAND Flash memory with 4-level programmed cells has been developed successfully. The cost-effective small chip has been fabricated in 70-nm CMOS technology. To decrease the chip size, a one-sided pad arrangement with compacted core architecture and a block address expansion scheme without block redundancy replacement have been introduced. With these methods, the chip size has been reduced to 146 mm2, which is 4.9% smaller than the conventional chip. In terms of performance, the program throughput reaches 6 MB/s at 4-KB page operation, which is significantly faster than previously reported and very competitive with binary Flash memories. This high performance has been achieved by the combination of the multi-level cell (MLC) programming with write caches and with the program voltage compensation technique for neighboring select transistors. The read throughput reaches 60 MB/s using 16I/O configuration.
  • Keywords
    CMOS memory circuits; NAND circuits; cache storage; compensation; flash memories; memory architecture; multivalued logic circuits; nanotechnology; programmable logic devices; 4-level programmed cells; 70 nm; 8 Gbit; CMOS technology; block address expansion scheme; chip size reduction; compacted core architecture; multi-level NAND flash memory; multi-level cell programming; program voltage compensation technique; write caches; CMOS technology; Cellular phones; Costs; Digital cameras; Flash memory; Handheld computers; History; Throughput; Universal Serial Bus; Voltage; Flash memory; NAND Flash memory; high-speed programming; multi-level cell; pad arrangement;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2005.859027
  • Filename
    1564357