Title :
High resolution spherical microwave holography
Author :
Guler, Michael G. ; Joy, Edward B.
Author_Institution :
660 Eng. Drive, Norcross, GA, USA
fDate :
5/1/1995 12:00:00 AM
Abstract :
A practical technique is developed to determine the electric and/or magnetic field on objects and sources inside a spherical measurement surface. The technique, known as spherical microwave holography (SMH), provides a nondestructive, nonintrusive method of point-by-point evaluation of antennas and radomes over their spatial extent. The resolution capability of SMH is developed and demonstrated by measurements. Resolution in SMH is only limited by the measurement system´s capabilities. Dielectric and metallic obstacles on the surface of a radome are located and identified. Resolution as small as 0.33λ0 is demonstrated
Keywords :
antenna testing; electric field measurement; magnetic field measurement; microwave holography; microwave measurement; nondestructive testing; radomes; antennas; dielectric obstacles; electric field; high resolution spherical microwave holography; magnetic field; metallic obstacles; nondestructive nonintrusive method; point-by-point evaluation; radomes; resolution capability; spherical measurement surface; Antenna measurements; Dielectric measurements; Electric variables measurement; Holographic optical components; Holography; Magnetic field measurement; Microwave antennas; Optical receivers; Optical surface waves; Phase measurement;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
