High resolution spherical microwave holography

Author

Guler, Michael G. ; Joy, Edward B.

Author_Institution

660 Eng. Drive, Norcross, GA, USA

Volume

43

Issue

5

fYear

1995

fDate

5/1/1995 12:00:00 AM

Firstpage

464

Lastpage

472

Abstract

A practical technique is developed to determine the electric and/or magnetic field on objects and sources inside a spherical measurement surface. The technique, known as spherical microwave holography (SMH), provides a nondestructive, nonintrusive method of point-by-point evaluation of antennas and radomes over their spatial extent. The resolution capability of SMH is developed and demonstrated by measurements. Resolution in SMH is only limited by the measurement system´s capabilities. Dielectric and metallic obstacles on the surface of a radome are located and identified. Resolution as small as 0.33λ₀ is demonstrated

Keywords

antenna testing; electric field measurement; magnetic field measurement; microwave holography; microwave measurement; nondestructive testing; radomes; antennas; dielectric obstacles; electric field; high resolution spherical microwave holography; magnetic field; metallic obstacles; nondestructive nonintrusive method; point-by-point evaluation; radomes; resolution capability; spherical measurement surface; Antenna measurements; Dielectric measurements; Electric variables measurement; Holographic optical components; Holography; Magnetic field measurement; Microwave antennas; Optical receivers; Optical surface waves; Phase measurement;

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/8.384190

Filename

384190