• DocumentCode
    777763
  • Title

    Experimental study of X-pinch in a submicrosecond regime

  • Author

    Aranchuk, Leonid E. ; Larour, Jean ; Chuvatin, Alexandre S.

  • Author_Institution
    Lab. de Phys. et Technologie des Plasmas, Ecole Polytechnique, Palaiseau, France
  • Volume
    33
  • Issue
    2
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    990
  • Lastpage
    996
  • Abstract
    X-pinch plasmas are known as point-like X-ray sources with the potential application for backlighting diagnostics. X-pinches are commonly driven by large pulsed power generators delivering high-voltage pulses with short rise-times, typically under 100 ns. When operating with slower capacitor banks, X-pinches become less reliable because of the arising X-ray pulse jitter and because of the appearance of two or more X-ray bursts coming from multiple hot spots. In this paper, a very compact inductance-capacitance (LC) generator with the current rise-time of 200 ns was used to drive molybdenum and tungsten wire X-pinches. A single peak, small shot-to-shot jitter emission of X-rays was obtained. Time-integrated penumbral imaging recorded the X-ray source dimension of less than 15 μm in the spectral region above 2.4 keV. The total yield of more than 80 mJ was registered with the radiation pulse duration as short as 1.5 ns. The appearance of single- or multiple-source core structures is discussed in correlation with used wire material and X-pinch torsion angle. The results confirm the possibility of using an X-pinch driven by a fast compact capacitor bank for backlighting applications.
  • Keywords
    molybdenum; pinch effect; plasma X-ray sources; plasma diagnostics; tungsten; 200 ns; Mo; W; X-pinch plasmas; X-pinch torsion angle; X-ray bursts; X-ray pulse jitter; backlighting diagnostics; capacitor banks; inductance-capacitance generator; molybdenum wire; multiple-source core structure; point-like X-ray sources; pulsed power generators; shot-to-shot jitter emission; single-source core structure; submicrosecond regime; time-integrated penumbral imaging; tungsten wire; Capacitors; Jitter; Plasma applications; Plasma diagnostics; Plasma sources; Plasma x-ray sources; Power generation; Pulse generation; Wire; X-ray imaging; Penumbral imaging; X-pinch; X-ray source; pinhole imaging;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2005.846877
  • Filename
    1420654