DocumentCode
777793
Title
Radiation Damage in SiC
Author
Babcock, Richard
Author_Institution
Westinghouse Research Laboratories Pittsburgh, Pennsylvania
Volume
12
Issue
6
fYear
1965
Firstpage
43
Lastpage
47
Abstract
SiC has a band gap energy of about 2.9 ev; intrinsic SiC would be an excellent insulator at room temperature. In practice, the uncompensated room temperature resistivity of single crystal SiC rarely exceeds 100 ¿-cm. Information about radiation damage in SiC is scanty. Rates of charge carrier removal upon irradiation are similar to those found in Si. Most of the defects anneal at less than 8000C; within the operating range of some SiC devices. We have been interested principally in SiC p-n junctions, as rectifiers and as radiation detectors, and have studied their degradation in charged particle and neutron fluxes. Useful life is 1-100 times greater than can be achieved in comparable Si devices.
Keywords
Annealing; Charge carriers; Conductivity; Insulation; P-n junctions; Photonic band gap; Radiation detectors; Rectifiers; Silicon carbide; Temperature;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1965.4323922
Filename
4323922
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