• DocumentCode
    777793
  • Title

    Radiation Damage in SiC

  • Author

    Babcock, Richard

  • Author_Institution
    Westinghouse Research Laboratories Pittsburgh, Pennsylvania
  • Volume
    12
  • Issue
    6
  • fYear
    1965
  • Firstpage
    43
  • Lastpage
    47
  • Abstract
    SiC has a band gap energy of about 2.9 ev; intrinsic SiC would be an excellent insulator at room temperature. In practice, the uncompensated room temperature resistivity of single crystal SiC rarely exceeds 100 ¿-cm. Information about radiation damage in SiC is scanty. Rates of charge carrier removal upon irradiation are similar to those found in Si. Most of the defects anneal at less than 8000C; within the operating range of some SiC devices. We have been interested principally in SiC p-n junctions, as rectifiers and as radiation detectors, and have studied their degradation in charged particle and neutron fluxes. Useful life is 1-100 times greater than can be achieved in comparable Si devices.
  • Keywords
    Annealing; Charge carriers; Conductivity; Insulation; P-n junctions; Photonic band gap; Radiation detectors; Rectifiers; Silicon carbide; Temperature;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1965.4323922
  • Filename
    4323922