DocumentCode :
77783
Title :
A Compact Transregional Model for Digital CMOS Circuits Operating Near Threshold
Author :
Keller, S. ; Harris, David Money ; Martin, Alain J.
Author_Institution :
Dept. of Comput. Sci., California Inst. of Technol., Pasadena, CA, USA
Volume :
22
Issue :
10
fYear :
2014
fDate :
Oct. 2014
Firstpage :
2041
Lastpage :
2053
Abstract :
Power dissipation is currently one of the most important design constraints in digital systems. In order to reduce power and energy demands in the foremost technology, namely CMOS, it is necessary to reduce the supply voltage to near the device threshold voltage. Existing analytical models for MOS devices are either too complex, thus obscuring the basic physical relations between voltages and currents, or they are inaccurate and discontinuous around the region of interest, i.e., near threshold. This paper presents a simple transregional compact model for analyzing digital circuits around the threshold voltage. The model is continuous, physically derived (by way of a simplified inversion-charge approximation), and accurate over a wide operational range: from a few times the thermal voltage to approximately twice the threshold voltage in modern technologies.
Keywords :
CMOS digital integrated circuits; integrated circuit design; integrated circuit modelling; MOS device analytical model; basic physical relations; compact transregional model; design constraints; device threshold voltage; digital CMOS circuits; digital systems; energy demand reduction; power demand reduction; power dissipation; simplified inversion-charge approximation; supply voltage reduction; Approximation methods; Equations; Integrated circuit modeling; Mathematical model; Mobile communication; Semiconductor device modeling; Threshold voltage; Circuit simulation; EKV; digital circuits; integrated circuit modeling; low-power electronics; minimum-energy point; near-threshold CMOS; subthreshold CMOS; subthreshold CMOS.;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2013.2282316
Filename :
6651857
Link To Document :
بازگشت