Novel methods for circuit worst-case tolerance analysis

Author

Tian, Wei ; Ling, Xie-Ting ; Liu, Ruey-wen

Author_Institution

Dept. of Electron. Eng., Fudan Univ., Shanghai, China

Volume

43

Issue

4

fYear

1996

fDate

4/1/1996 12:00:00 AM

Firstpage

272

Lastpage

278

Abstract

The method, presented by E. R. Hansen (see SIAM J. Numer. Anal., vol. 29, no. 5, p. 1493-1503, 1992) for solving interval linear equations, is improved to meet the requirements of circuit worst-case tolerance analysis. Based on the solutions of interval linear equations, an analytic algorithm and an accurate algorithm are constructed. It is shown that the performances of the two algorithms are complementary: the analytic algorithm runs faster than the accurate algorithm, but has more interval expansion error. Techniques for AC tolerance analysis, time-domain tolerance analysis and DC tolerance analysis are discussed respectively. Some examples and comparisons are given

Keywords

circuit analysis computing; error analysis; linear network analysis; nonlinear network analysis; sensitivity analysis; step response; time-domain analysis; transient response; AC tolerance analysis; DC tolerance analysis; accurate algorithm; analytic algorithm; circuit worst-case tolerance analysis; interval expansion error; interval linear equations; time-domain tolerance analysis; Algorithm design and analysis; Circuit analysis computing; Circuit synthesis; Manufacturing; Mathematics; Nonlinear equations; Performance analysis; Time domain analysis; Tolerance analysis; Vectors;

fLanguage

English

Journal_Title

Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on

Publisher

ieee

ISSN

1057-7122

Type

jour

DOI

10.1109/81.488806

Filename

488806