DocumentCode :
778312
Title :
Technique and Apparatus for Determining the Response of Scintillators and Semiconductors to Low Energy X-Ray Excitation
Author :
Aitken, D.W. ; Marcum, A.I. ; Zulliger, H.R.
Author_Institution :
Department of Physics and High Energy Physics Laboratory Stanford University Stanford, California
Volume :
13
Issue :
1
fYear :
1966
Firstpage :
287
Lastpage :
296
Abstract :
This paper describes the apparatus and techniques that are being developed at our laboratory in order to investigate the response of scintillators and semiaonductors to X-ray excitation. Examples of the signal averaging technique are shown using the highly attenuated output of a precision pulse generator as the signal source. A discussion of the intended applications of the apparatus is presented.
Keywords :
Collimators; Face detection; Laboratories; Physics; Production; Pulse circuits; Pulse generation; Semiconductor device noise; X-ray detection; X-ray detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1966.4323977
Filename :
4323977
Link To Document :
بازگشت