Technique and Apparatus for Determining the Response of Scintillators and Semiconductors to Low Energy X-Ray Excitation

This paper describes the apparatus and techniques that are being developed at our laboratory in order to investigate the response of scintillators and semiaonductors to X-ray excitation. Examples of the signal averaging technique are shown using the highly attenuated output of a precision pulse generator as the signal source. A discussion of the intended applications of the apparatus is presented.