• DocumentCode
    778732
  • Title

    IIP3 estimation from the gain compression curve

  • Author

    Cho, Choongeol ; Eisenstadt, William R. ; Stengel, Bob ; Ferrer, Enrique

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
  • Volume
    53
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    1197
  • Lastpage
    1202
  • Abstract
    Classical analysis of transistor amplifier performance shows 9.6 dB as the difference between the input-referred third-order intercept point (IIP3) and 1-dB gain compression point. An analysis of amplifier gain compression shows that this is not the case, that at least fifth-order harmonics play a role in the gain compression curve and that the classical analysis is incorrect for submicrometer RF transistor amplifiers. Another approach is presented that estimates the values of IIP3 from a single-tone RF power gain data. This approach is successfully applied to simulations of a common-source amplifier and a differential amplifier with resistive load. Measurements of commercial amplifiers show that IIP3 can be estimated from their gain compression curves. This modeling approach of determining IIP3 from gain compression curves can simplify test protocol, shorten test time, and lower cost of integrated-circuit production test.
  • Keywords
    integrated circuit testing; microwave integrated circuits; nonlinear network analysis; radiofrequency amplifiers; 1 dB; IIP3 estimation; RF power gain data; amplifier gain compression; amplifier nonlinear characteristics; common-source amplifier; differential amplifier; fifth-order harmonics; gain compression curve; input-referred third-order intercept point; integrated-circuit production test; resistive load; submicrometer RF transistor amplifiers; transistor amplifier; Costs; Differential amplifiers; Gain measurement; Harmonic analysis; Performance analysis; Performance gain; Protocols; Radio frequency; Radiofrequency amplifiers; Testing; 1-dB gain compression point; Amplifier nonlinear characteristics; input-referred third-order intercept point (IIP3) estimation; integrated-circuit (IC) test; third-order intercept point (IP3);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.845746
  • Filename
    1420748