• DocumentCode
    778818
  • Title

    Plastic-encapsulated microcircuit reliability and cost-effectiveness study

  • Author

    Emerson, Douglas ; Hakim, Edward ; Govind, Anand

  • Author_Institution
    Rockwell Int. Corp., Cedar Rapids, IA, USA
  • Volume
    45
  • Issue
    1
  • fYear
    1996
  • fDate
    3/1/1996 12:00:00 AM
  • Firstpage
    19
  • Lastpage
    22
  • Abstract
    This study evaluates the reliability and cost-effectiveness of using commercial plastic-encapsulated microcircuits (PEM) in a typical military system, with a view to increasing their acceptability in military applications. The cost comparison indicates an average 6-fold decrease in cost when commercial devices are used. Assurance testing did not reveal any special problems with commercial parts. Thus, if commercial PEM were proven to be sufficiently reliable for an intended military application, large cost savings would be gained by using them instead of hermetic packages. The 4.5 sigma enhanced inspection program and the process-control methods suggested here would enhance the manufacturing yield of the PLGR (precision lightweight global positioning system receiver) by encouraging improvements in the manufacturing process while simultaneously cutting the cost of a 100% rescreen to qualify the final product. Neither the requirements assurance tests (including the step-stress test-analyze-and-fix test), nor the reliability demonstration test, nor the operational test, showed more failures than are typical for any new development, and no problems unique to PEM were observed. Thus, the use of PEM did not lead to any special problems that caused PLGR-use specifications to be violated. Complete failure analysis of the isolated parts is in progress, and the results will help to understand the specific reliability issues involved with the use of PEM in military systems. These issues can then be addressed to improve the acceptability of such devices in future military applications
  • Keywords
    economics; encapsulation; failure analysis; inspection; integrated circuit manufacture; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; military systems; plastic packaging; process control; 4.5 sigma enhanced inspection program; assurance testing; cost savings; cost-effectiveness; failure analysis; manufacturing yield; military system; operational test; plastic-encapsulated microcircuit reliability; precision lightweight global positioning system receiver; process-control methods; reliability demonstration test; step-stress test-analyze-and-fix test; Aerospace electronics; Costs; Failure analysis; Laboratories; Manufacturing processes; Military communication; Military standards; Packaging; Process control; System testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.488910
  • Filename
    488910