Title :
Noise analysis of correlated double sampling SC integrators with a hold capacitor
Author_Institution :
Motorola Labs., Schaumburg, IL, USA
Abstract :
Noise performance of the correlated double sampling switched-capacitor integrators incorporating a supplementary hold capacitor is analyzed. These types of integrators rely on an extra capacitor to attenuate the amplifier low-frequency noise. Approximate expressions for the input-referred noise of the integrators are derived. It is shown that a large parasitic capacitance at the amplifier input may seriously degrade the low-frequency noise performance of such structures.
Keywords :
capacitance; circuit noise; integrating circuits; nonlinear network analysis; signal sampling; switched capacitor networks; correlated double sampling SC integrators; input-referred noise; low-frequency noise; noise analysis; parasitic capacitance; switched-capacitor integrators; Broadcasting; Capacitors; Circuits; Hafnium; High power amplifiers; Low-frequency noise; Power amplifiers; Power generation; Power system harmonics; Sampling methods;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
DOI :
10.1109/TCSI.2003.816314
