Title :
Temperature dependence of the permittivity and loss tangent of high-permittivity materials at terahertz frequencies
Author :
Berdel, Klaus ; Rivas, Jaime Gémez ; Bolívar, Peter Haring ; De Maagt, Peter ; Kurz, Heinrich
Author_Institution :
Inst. fur Halbleitertechnik, Rheinisch Westfaelische Tech. Hochschule Aachen, Germany
fDate :
4/1/2005 12:00:00 AM
Abstract :
An analysis including the temperature dependence of the permittivity and loss tangent of three low-cost and high-permittivity materials (zirconium-tin-titanate, alumina, and titanium-dioxide) in the terahertz frequency range is presented. Such dielectric materials find varied applications in microwave and terahertz systems and components. Their effective use under varying environmental conditions or in space applications requires a detailed knowledge about temperature dependencies. Here, measurements using broad-band terahertz time-domain spectroscopy are presented in the temperature range from 10 to 323 K. It is shown that zirconium-tin-titanate and alumina provide a good thermal stability of the permittivity, whereas the permittivity of titanium-dioxide exhibits a strong dependence on the temperature.
Keywords :
ceramics; dielectric materials; permittivity; submillimetre wave spectroscopy; temperature; time-domain analysis; titanium compounds; 10 to 323 K; alumina; ceramics; dielectric materials; dielectric thermal factors; high-permittivity materials; loss tangent; microwave system; permittivity; submillimeter waves; terahertz frequencies; terahertz system; thermal stability; time-domain spectroscopy; titanium compounds; titanium-dioxide; zirconium-tin-titanate; Dielectric materials; Dielectric measurements; Frequency; Permittivity measurement; Spectroscopy; Submillimeter wave measurements; Temperature dependence; Temperature distribution; Thermal stability; Time domain analysis; Ceramics; dielectric materials; dielectric thermal factors; measurement; submillimeter waves; titanium compounds;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2005.845752