Connecting parametric aging to catastrophic failure through thermodynamics

Author

Feinberg, A.A. ; Widom, A.

Author_Institution

TASC, Reading, MA, USA

Volume

45

Issue

1

fYear

1996

fDate

3/1/1996 12:00:00 AM

Firstpage

28

Lastpage

33

Abstract

There have been numerous studies with Arrhenius theory in reliability. However, very few actually apply to parametric reliability analysis. This paper provides fundamental details in this area of reliability physics. The authors derive a thermally activated time-dependent model for both parametric and catastrophic Arrhenius aging. It is shown how aging dynamics depend upon thermodynamics specific to device reliability physics and how catastrophic phenomena can be correlated to device life dynamics

Keywords

ageing; catastrophe theory; failure analysis; reliability theory; thermal analysis; thermodynamics; Arrhenius theory; aging dynamics; batteries; catastrophic failure; crystal resonators; life dynamics; parametric aging; parametric reliability analysis; reliability physics; thermally activated time-dependent model; thermodynamics; Aging; Failure analysis; Joining processes; Kinetic theory; Physics; Reliability theory; Semiconductor device reliability; Temperature; Thermal degradation; Thermodynamics;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.488913

Filename

488913