DocumentCode :
778973
Title :
Monolithic optoelectronic circuit design and fabrication by epitaxial growth on commercial VLSI GaAs MESFET´s
Author :
Shenoy, Knshna V. ; Fonstad, Clifton G., Jr. ; Grot, Annette C. ; Psaltis, Demetri
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Volume :
7
Issue :
5
fYear :
1995
fDate :
5/1/1995 12:00:00 AM
Firstpage :
508
Lastpage :
510
Abstract :
A technique for realizing large-scale monolithic OEIC´s, which involves epitaxially growing GaAs-based heterostructures on fully metallized commercial VLSI GaAs MESFET integrated circuits, has recently been reported. In the initial work the circuits and LED´s occupied distinct halves of a chip, the dielectric growth window was wet-etched after circuit fabrication, and the LED´s required both n and p ohmic contacts to be formed after epitaxial growth. In this letter we report the use of standard foundry process etches to open dielectric growth windows intermixed with circuitry and the growth of n-side-down LED´s on a source/drain ion-implanted n/sup +/ region serving as the n ohmic contact. A winner-take-all neural circuit is demonstrated using these advances, which are important steps toward realizing higher levels of circuit integration.<>
Keywords :
MESFET integrated circuits; epitaxial growth; field effect logic circuits; gallium arsenide; integrated optoelectronics; ion implantation; light emitting diodes; neural chips; optical fabrication; semiconductor growth; GaAs; GaAs-based heterostructures; LED; circuit fabrication; circuit integration; commercial VLSI GaAs MESFET´s; dielectric growth window; epitaxial growth; foundry process; fully metallized; ion-implanted; large-scale monolithic OEIC´s; monolithic optoelectronic circuit design; monolithic optoelectronic circuit fabrication; n ohmic contact; n-side-down LED´s; n/sup +/ region; ohmic contacts; wet-etched; winner-take-all neural circuit; Circuit synthesis; Dielectrics; Epitaxial growth; Gallium arsenide; Integrated circuit metallization; Large scale integration; MESFET integrated circuits; Ohmic contacts; Optical device fabrication; Very large scale integration;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.384526
Filename :
384526
Link To Document :
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