• DocumentCode
    779216
  • Title

    Modeling of metamaterials with negative refractive index using 2-D shunt and 3-D SCN TLM networks

  • Author

    So, Poman P M ; Du, Huilian ; Hoefer, Wolfgang J R

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Victoria, BC, Canada
  • Volume
    53
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    1496
  • Lastpage
    1505
  • Abstract
    We present two novel techniques for modeling two- and three-dimensional metamaterials with negative refractive index by transmission-line matrix (TLM) networks. The TLM networks are numerical models of reactively loaded periodic networks that support backward waves and constitute artificial media with negative refractive index. The TLM models, their implementations, and results computed with the models will be presented.
  • Keywords
    dielectric materials; electromagnetic wave scattering; metamaterials; periodic structures; permittivity; refractive index; transmission line matrix methods; 2D metamaterials; 2D shunt SCN TLM networks; 3D SCN TLM networks; 3D metamaterials; artificial dielectrics; artificial media; backward waves; inter-cell scattering procedure; left-handed media; metamaterial modeling; negative permeability; negative permittivity; negative refractive index; reactively loaded periodic networks; symmetrical condensed node; transmission-line matrix method; transmission-line matrix networks; Capacitors; Circuit simulation; Inductors; Metamaterials; Numerical models; Periodic structures; Refractive index; Shunt (electrical); Transmission line matrix methods; Transmission lines; Artificial dielectrics; backward waves; focusing; inter-cell scattering procedure; left-handed media (LHM); metamaterials; negative permeability; negative permittivity; negative refractive index; periodic structures; transmission-line matrix (TLM) method;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.845196
  • Filename
    1420790