DocumentCode
779324
Title
Dependence of critical current density on oxygen exposure in Nb-AlO/sub x/-Nb tunnel junctions
Author
Kleinsasser, A.W. ; Miller, R.E. ; Mallison, W.H.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
5
Issue
1
fYear
1995
fDate
3/1/1995 12:00:00 AM
Firstpage
26
Lastpage
30
Abstract
We demonstrate that a large fraction of the available data relating the critical current density J/sub c/ of superconducting Nb-AlO/sub x/-Nb tunnel junctions to oxidation parameters can be accounted for by a single, nearly universal dependence. For fixed oxidation temperature, J/sub c/ does not depend independently on oxygen partial pressure and oxidation time, but only on their product. There are two distinct regimes in this dependence, corresponding to high and low J/sub c/.<>
Keywords
aluminium compounds; critical current density (superconductivity); niobium; oxidation; superconductive tunnelling; Nb-AlO-Nb; critical current density; oxidation; oxygen exposure; superconducting Nb-AlO/sub x/-Nb tunnel junctions; Artificial intelligence; Critical current density; Josephson junctions; Laboratories; Niobium; Oxidation; Oxygen; Substrates; Temperature dependence; Thickness control;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.384565
Filename
384565
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