DocumentCode
779513
Title
Fluctuations of Energy Loss in Semiconductor Detectors
Author
Maccabee, Howard D. ; Raju, Mudundi R. ; Tobias, Cornelius A.
Author_Institution
Lawrence Radiation Laboratory University of California Berkeley, California
Volume
13
Issue
3
fYear
1966
fDate
6/1/1966 12:00:00 AM
Firstpage
176
Lastpage
179
Abstract
Significant fluctuations and broadening of the energy-loss spectrum are expected in certain cases of passage of charged particles through "thin" detectors. Experimental measurements of this phenomenon (by use of lithium-drifted silicon detectors) are in good agreement with the rigorous theory of Vavilov, as tabulated by Seltzer and Berger.
Keywords
Atomic measurements; Electrons; Energy exchange; Energy loss; Energy measurement; Fluctuations; Radiation detectors; Semiconductor radiation detectors; Shape measurement; Silicon;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1966.4324096
Filename
4324096
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