DocumentCode
779681
Title
Analysis of nonlinear behavior of power HBTs
Author
Kim, Woonyun ; Kang, Sanghoon ; Lee, Kyungho ; Chung, Minchul ; Kang, Jongchan ; Kim, Bumman
Author_Institution
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., South Korea
Volume
50
Issue
7
fYear
2002
fDate
7/1/2002 12:00:00 AM
Firstpage
1714
Lastpage
1722
Abstract
To accurately understand the linear characteristics of a heterojunction bipolar transistor (HBT), we developed an analytical nonlinear HBT model using Volterra-series analysis. The model considers four nonlinear components: rπ, Cdiff, Cdepl, and gm. It shows that nonlinearities of r π and Cdiff are almost completely canceled by g m nonlinearity at all frequencies. The residual gm nonlinearity is highly degenerated by input circuit impedances. Therefore, rπ, Cdiff, Cdepl, and g m nonlinearities generate less harmonics than Cbc nonlinearity. If Cbc is linearized, gm is the main nonlinear source of HBT, and Cdepl becomes very important at a high frequency. The degeneration resistor RE is more effective than RB for reducing gm nonlinearity. This analysis also shows the dependency of the third-order intermodulation (IM3) on the terminations of the source second harmonic impedances. The IM3 of HBT is significantly reduced by setting the second harmonic impedances of ZS,2ω2 = 0 and ZS,ω2-ω1 = 0
Keywords
UHF bipolar transistors; Volterra series; heterojunction bipolar transistors; intermodulation distortion; power bipolar transistors; semiconductor device models; UHF; Volterra-series analysis; analytical nonlinear model; degeneration resistor; heterojunction bipolar transistor; input circuit impedances; nonlinear behavior; nonlinear components; power HBTs; source second harmonic impedances; third-order intermodulation; Analytical models; Capacitance; Equivalent circuits; Frequency; Heterojunction bipolar transistors; Impedance; Intermodulation distortion; Microwave technology; Resistors; Voltage;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2002.800396
Filename
1017635
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