Evaluation and improvement of fault coverage of conformance testing by UIO sequences

Author

Lombardi, F. ; Shen, Y.-N.

Author_Institution

Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA

Volume

40

Issue

8

fYear

1992

fDate

8/1/1992 12:00:00 AM

Firstpage

1288

Lastpage

1293

Abstract

The fault coverage of testing protocols using unique input/output (UIO) sequences is analyzed. UIO sequences can be efficiently employed in checking the conformance specifications of protocols by using transition testing. The test sequence is found using the rural Chinese postman tour algorithm. A comprehensive fault model is developed, and analytical expressions are given for the fault coverage. The conditions for undetectability are analyzed, and a new algorithm is proposed. Simulation results and illustrative examples are presented. Overhead issues are discussed, and significant improvements are shown for achieving 100% fault coverage. The major advantage of the proposed approach is that it provides the theoretical basis for fault coverage evaluation of protocol testing using UIO sequences

Keywords

conformance testing; finite automata; protocols; UIO sequences; comprehensive fault model; conformance testing; fault coverage; finite state machine; overhead issues; protocols; rural Chinese postman tour algorithm; transition testing; unique input/output sequences; Algorithm design and analysis; Automata; Communications Society; Computer science; Costs; Fault detection; Magnetic heads; Protocols; Testing;

fLanguage

English

Journal_Title

Communications, IEEE Transactions on

Publisher

ieee

ISSN

0090-6778

Type

jour

DOI

10.1109/26.156632

Filename

156632