• DocumentCode
    779703
  • Title

    Characteristics of Some Large, Coaxial Lithium-Drift Semiconductor Gamma-Ray Spectrometers

  • Author

    Tavendale, A.J.

  • Author_Institution
    General Nucleonics Division, Australian Atomic Energy Commission Research Establishment, Sydney, N.S.W., Australia
  • Volume
    13
  • Issue
    3
  • fYear
    1966
  • fDate
    6/1/1966 12:00:00 AM
  • Firstpage
    315
  • Lastpage
    327
  • Abstract
    Large-volume, lithium drift germanium and silicon diodes have been fabricated using the "coaxial" configuration and their diode and ¿-ray spectrometer characteristics investigated at liquid nitrogen temperatures (770K). Techniques are described which have been used to drift volumes up to 40 cm3 from 10 ohm-cm, Ga-doped germanium and 22 cm3 from 1100 ohm-cm, B-doped silicon. Drift data, diode d.c. conditions for best spectrometer operation, and experimental resolutions for Co-57,60 source ¿-rays are tabulated for Ge diodes, 14.5 - 40 cm3 active volume, and other sections taken from these. ¿-ray spectra up to 17 MeV ¿-ray energy are presented for typical diodes Resolutions (FWHM) of 2.0, 3.4 and 7.3 keV on the full-energy peak of 122, 1173 and 2754 keV ¿-rays have been obtained from a 14 cm3 Ge(Li) diode using a cooled, FET input stage preamplifier. The performance of a coaxial Ge(Li) diode with a guard-ring construction for high bias voltage operation is described. Coaxial Si(Li) diodes primarily intended for application as ¿-ray pair spectrometers have been drifted to 22 cm3 active volume. The spectral responses to 122 and 2754 keV ¿-rays from a smaller, 11.5 cm3 Si(Li) diode are given. Problems in drifting "single-ended" coaxial Si(Li) diode structures are discussed.
  • Keywords
    Coaxial components; Energy resolution; FETs; Germanium; Lithium; Nitrogen; Semiconductor diodes; Silicon; Spectroscopy; Temperature;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1966.4324114
  • Filename
    4324114