• DocumentCode
    779950
  • Title

    Background Reduction in Charged-Particle Spectroscopy with Fast-Gated Electronics

  • Author

    Katzenstein, Henry S.

  • Author_Institution
    Solid State Radiations, Inc. Los Angeles, California
  • Volume
    13
  • Issue
    3
  • fYear
    1966
  • fDate
    6/1/1966 12:00:00 AM
  • Firstpage
    527
  • Lastpage
    536
  • Abstract
    In many experiments involving charged-particle spectroscopy using semiconductor detectors, the rate at which data can be obtained is frequently severely limited by large background fluxes of gamma rays and electrons. While the use of detectors whose sensitive depth is limited to that necessary to stop the charged particle of interest can substantially reduce the background contributions, pulse pile-up effects can obscure the desired spectral information through either accidental coincidence between an electron pulse and a heavy charged-particle pulse or through the simultaneous detection of several electrons. These pile-up effects can be minimized by the use of fast current-mode amplification which reduces the system resolving time essentially to the collection time of the detector, and a linear gate to permit integrating the eharge due to the selected events only. While such systems do not exhibit the excellent resolution of low noise charge-sensitive amplifiers, alpha particle line widths of 60 keV have been observed in the presence of electron fluxes as high as 108 electrons/cm2/second. Several examples of aceelerator, reactor and neutron spectroscopy experiments are given.
  • Keywords
    Alpha particles; Electrons; Event detection; Gamma ray detection; Gamma ray detectors; Gamma rays; Low-noise amplifiers; Pulse amplifiers; Semiconductor device noise; Spectroscopy;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1966.4324137
  • Filename
    4324137