DocumentCode :
779974
Title :
Modeling good conductors using the finite-difference, time-domain technique
Author :
Chamberlin, Kent ; Gordon, Lauchlan
Author_Institution :
Dept. of Electr. & Comput. Eng., New Hampshire Univ., Durham, NH, USA
Volume :
37
Issue :
2
fYear :
1995
fDate :
5/1/1995 12:00:00 AM
Firstpage :
210
Lastpage :
216
Abstract :
Finite-difference, time-domain (FDTD) is based upon the assumption that field behavior between sample points (i.e., cell nodes) is linear; for propagation in lossless or low-loss materials, the assumption of linearity will be valid as long as the number of cells per wavelength is kept above some minimum value. For good conductors, where the wavelength decreases many orders of magnitude from its free-space size, and the fields are decaying exponentially, it becomes impractical to shrink the cell size so as to maintain linearity between cells. When the number of cells per wavelength criterion is violated at a boundary, FDTD will not yield correct estimates of reflection from, or transmission into, that boundary. The work presented details and provides validation for two approaches that can be used to achieve realistic results when modeling good conductors with FDTD using practical cell sizes. These approaches do not require modifications to the FDTD algorithms, and do not affect program execution times. Achieving accurate loss estimates will be of particular interest to those modeling resonant structures using FDTD
Keywords :
antenna theory; conductors (electric); electromagnetic wave reflection; electromagnetic wave transmission; finite difference time-domain analysis; resonance; TD algorithms; antenna loading; cell nodes; cell sizes; conductors; enclosures; exponentially decaying fields; field behavior; finite-difference time-domain technique; free-space size; lossless materials; low-loss materials; reflection; resonant structures modeling; sample points; transmission; wavelength; Conducting materials; Conductivity; Conductors; Copper; Finite difference methods; Frequency; Linearity; Magnetic resonance; Propagation losses; Time domain analysis;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.385885
Filename :
385885
Link To Document :
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