Title :
Measured distortion of the output-waveform of an integrated OPAMP due to substrate noise
Author_Institution :
EMC Lab., Katholieke Ind. Hogeschool, Oostende, Belgium
fDate :
5/1/1995 12:00:00 AM
Abstract :
In mixed signal applications, interference problems due to ground noise and substrate noise are well known. The problem is becoming very timely in applications, such as the logical control of analog amplifiers in monolithic technologies, because of two reasons: the use of higher clock frequencies and high speed logic circuitry, and the technologies moving into 1 μ and submicron regions. In this paper, some measured results are reported on the effects caused by logical control pulses on the behavior of OPAMP´s. The results were gained from sophisticated experiments, and can serve as a basis for further theoretical investigations
Keywords :
analogue integrated circuits; electromagnetic interference; integrated circuit noise; integrated circuit testing; mixed analogue-digital integrated circuits; operational amplifiers; analog amplifiers; clock frequencies; ground noise; high speed logic circuitry; integrated OPAMP; interference problems; logical control; logical control pulses; mixed signal applications; monolytic technologies; output-waveform distortion; substrate noise; Circuits; Demodulation; Differential amplifiers; Distortion measurement; Frequency; Noise measurement; Operational amplifiers; Radiofrequency interference; Statistics; Voltage;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
