DocumentCode
780608
Title
SEU fault tolerance in artificial neural networks
Author
Velazco, R. ; Assoum, A. ; Radi, N.E. ; Ecoffet, R. ; Botey, X.
Author_Institution
Lab. de Genie Inf., LGI/IMAG, Grenoble, France
Volume
42
Issue
6
fYear
1995
fDate
12/1/1995 12:00:00 AM
Firstpage
1856
Lastpage
1862
Abstract
In this paper we investigate the robustness of Artificial Neural Networks when encountering transient modification of information bits related to the network operation. These kinds of faults are likely to occur as a consequence of interaction with radiation. Results of tests performed to evaluate the fault tolerance properties of two different digital neural circuits are presented
Keywords
fault tolerant computing; neural chips; radiation effects; SEU fault tolerance; artificial neural networks; digital neural circuit; information bits; radiation interaction; robustness; transient modification; Application software; Artificial neural networks; Circuit faults; Circuit testing; Fault tolerance; Intelligent networks; Neurons; Performance evaluation; Single event upset; Very large scale integration;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.489227
Filename
489227
Link To Document