DocumentCode
780691
Title
Analytic approximation for charge current and deposition by 0.1 to 100 MeV electrons in thick slabs
Author
Frederickson, A.R. ; Bell, J.T. ; Beidl, E.A.
Author_Institution
USAF Phillips Lab, Hanscom AFB, MA, USA
Volume
42
Issue
6
fYear
1995
Firstpage
1910
Lastpage
1921
Abstract
An analytic function is developed for approximation of current penetration and charge deposition as a function of depth with normal incidence high energy electrons on slabs. The slabs must be thicker than the electron penetration depth and be composed of one material. Six adjustable parameters are evaluated to fit the function to tabulated ITS monte carlo and experimental electron deposition data. The results were developed from data spanning the entire energy range in C, Al, Cu, Ag, and Au, but are assumed to apply to all atomic number materials at all energies in the range.
Keywords
Algorithm design and analysis; Conducting materials; Conductivity; Electric breakdown; Electron beams; Indium tin oxide; Insulation; MOSFETs; Monte Carlo methods; Slabs;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1995.489235
Filename
489235
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