• DocumentCode
    780691
  • Title

    Analytic approximation for charge current and deposition by 0.1 to 100 MeV electrons in thick slabs

  • Author

    Frederickson, A.R. ; Bell, J.T. ; Beidl, E.A.

  • Author_Institution
    USAF Phillips Lab, Hanscom AFB, MA, USA
  • Volume
    42
  • Issue
    6
  • fYear
    1995
  • Firstpage
    1910
  • Lastpage
    1921
  • Abstract
    An analytic function is developed for approximation of current penetration and charge deposition as a function of depth with normal incidence high energy electrons on slabs. The slabs must be thicker than the electron penetration depth and be composed of one material. Six adjustable parameters are evaluated to fit the function to tabulated ITS monte carlo and experimental electron deposition data. The results were developed from data spanning the entire energy range in C, Al, Cu, Ag, and Au, but are assumed to apply to all atomic number materials at all energies in the range.
  • Keywords
    Algorithm design and analysis; Conducting materials; Conductivity; Electric breakdown; Electron beams; Indium tin oxide; Insulation; MOSFETs; Monte Carlo methods; Slabs;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1995.489235
  • Filename
    489235