Title :
SEE rate calculations using the effective flux approach and a generalized figure of merit approximation
Author_Institution :
9502 Babson Ct., Fairfax, VA, USA
fDate :
12/1/1995 12:00:00 AM
Abstract :
This paper explains the inconsistencies reported between effective flux calculations and integral rectangular parallelepiped calculations. The two types of calculation yield consistent results when the effective flux calculation is performed allowing for the appropriate geometry. A set of generic heavy ion cross section curves is introduced so that upset rate calculations can be compared as a function of device area and threshold. The figure of merit approximation is generalized so that it can be used for any orbit
Keywords :
integrated circuit modelling; integrated circuit testing; ion beam effects; ion beams; space vehicle electronics; SEE rate calculations; device area; effective flux approach; generalized figure of merit approximation; generic heavy ion cross section curves; integral rectangular parallelepiped calculations; single event effect; space environment; threshold; upset rate calculations; Area measurement; Equations; Extraterrestrial measurements; Geometry; Magneto electrical resistivity imaging technique; Orbital calculations; Shape;
Journal_Title :
Nuclear Science, IEEE Transactions on
