• DocumentCode
    780837
  • Title

    Microprocessor IDDQ testing: a case study

  • Author

    Josephson, D. ; Storey, Marc ; Dixon, D.

  • Author_Institution
    Hewlett-Packard Co., Fort Collins, CO
  • Volume
    12
  • Issue
    2
  • fYear
    1995
  • Firstpage
    42
  • Lastpage
    52
  • Abstract
    The author describe their incorporation of IDDQ testing into the design of the PA-7100LC PA-RISC microprocessor. They also discuss design guidelines, measurement techniques, results after fabrication and volume production, and suggested improvement. Their 900,000-transistor custom design supports IDDQ testing to ensure high quality without compromising 100-MHz-plus performance
  • Keywords
    computer testing; integrated circuit testing; microprocessor chips; reduced instruction set computing; PA-7100LC PA-RISC microprocessor; design guidelines; measurement techniques; microprocessor IDDQ testing; Automatic testing; CMOS technology; Circuit testing; Computer aided software engineering; Current measurement; Design methodology; Energy consumption; Guidelines; Microprocessors; Power measurement;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.386005
  • Filename
    386005
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=780837