Title :
Microprocessor IDDQ testing: a case study
Author :
Josephson, D. ; Storey, Marc ; Dixon, D.
Author_Institution :
Hewlett-Packard Co., Fort Collins, CO
Abstract :
The author describe their incorporation of IDDQ testing into the design of the PA-7100LC PA-RISC microprocessor. They also discuss design guidelines, measurement techniques, results after fabrication and volume production, and suggested improvement. Their 900,000-transistor custom design supports IDDQ testing to ensure high quality without compromising 100-MHz-plus performance
Keywords :
computer testing; integrated circuit testing; microprocessor chips; reduced instruction set computing; PA-7100LC PA-RISC microprocessor; design guidelines; measurement techniques; microprocessor IDDQ testing; Automatic testing; CMOS technology; Circuit testing; Computer aided software engineering; Current measurement; Design methodology; Energy consumption; Guidelines; Microprocessors; Power measurement;
Journal_Title :
Design & Test of Computers, IEEE
