• DocumentCode
    780847
  • Title

    Separate Absorption-Charge Multiplication Heterojunction Phototransistors With the Bandwidth-Enhancement Effect and Ultrahigh Gain-Bandwidth Product Under Near Avalanche Operation

  • Author

    Shi, J.-W. ; Wu, Y.-S. ; Hong, F.-C. ; Chiu, W.-Y.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Taoyuan
  • Volume
    29
  • Issue
    7
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    714
  • Lastpage
    717
  • Abstract
    We demonstrate a high-performance heterojunction phototransistor (HPT): separate absorption-charge multiplication HPT. The incorporation of an In0.52Al0.48 As-based multiplication layer in the In0.53 Ga0.47As-based collector layer of our HPT allows for a great shortening of the trapping time ( ~ ns to ~ 30 ps) of electrons at the base-emitter junction under near avalanche operation, without sacrificing the gain performance. The interaction between the photoconductive gain and avalanche gain means that it is not necessary to use high bias voltages (> 30 V ) in our device to attain high-gain (> 1times 104) performance. With this device design, we can achieve an extremely high (90 THz) gain-bandwidth product (1.6 GHz, 5.5 times 104) under a 6-V bias.
  • Keywords
    III-V semiconductors; aluminium compounds; avalanche photodiodes; gallium compounds; indium compounds; phototransistors; semiconductor heterojunctions; In0.52Al0.48As-In0.53Ga0.47As; avalanche gain; bandwidth-enhancement effect; base-emitter junction; gain-bandwidth product; near avalanche operation; photoconductive gain; separate absorption-charge multiplication heterojunction phototransistors; trapping time; ultrahigh gain-bandwidth product; voltage 6 V; Avalanche photodiodes; Charge carrier processes; Delay effects; Electron traps; Heterojunctions; Performance gain; Photoconducting devices; Phototransistors; Spontaneous emission; Voltage; Photodetector; phototransistor;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.2000668
  • Filename
    4558103