Radiation hardness of pn-CCDs for X-ray astronomy

Author

Meidinger, Norbert ; Strüder, Lothar ; Soltau, Heike ; Zanthier, Christoph V.

Author_Institution

Max-Planck-Inst. fur Extraterrestrische Phys., Garching bei Munchen, Germany

Volume

42

Issue

6

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

2066

Lastpage

2073

Abstract

Results of all extensive radiation hardness test of a full depletion pn-Charge Coupled Device (pn-CCD) detector are presented. The pn-CCD is a new type of Charge Coupled Device designed for X-ray spectroscopy in ESA´s cornerstone X-ray Multi Mirror (XMM) satellite mission. The devices were irradiated with 10 MeV-protons with fluences up to 6.5·10⁹ cm^-2. This is more than one order of magnitude higher than the equivalent proton radiation environment expected for the 10 year mission. The only effect to the device was a degradation of charge transfer efficiency (CTE) at temperatures around 120 K. At XMM´s operating temperature between 140 K and 170 K the performance of the detector will not significantly change during the 10 year mission. The degradation of the CTE was studied, and a method to improve it is described

Keywords

CCD image sensors; X-ray astronomy; X-ray detection; X-ray spectrometers; astronomical instruments; proton effects; radiation hardening (electronics); 10 MeV; ESA satellite mission; X-ray astronomy; X-ray multi mirror; X-ray spectroscopy; charge coupled device; charge transfer efficiency; degradation; pn-CCD detector; proton radiation; radiation hardness; Astronomy; Charge-coupled image sensors; Degradation; Mirrors; Protons; Radiation detectors; Satellites; Spectroscopy; Temperature; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.489254

Filename

489254