Title :
Soft X-ray characterization of perpendicular recording media
Author :
Fullerton, Eric E. ; Hellwig, Olav ; Ikeda, Yoshihiro ; Lengsfield, Byron ; Takano, Kentaro ; Kortright, Jeffery B.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fDate :
7/1/2002 12:00:00 AM
Abstract :
Various spectroscopy, imaging, and scattering techniques exploit core-level resonances accessible in the soft X-ray energies to obtain magnetic information in thin films with elemental specificity. In this paper, we describe the emerging technique of resonant soft X-ray small-angle scattering (SAS) as a probe of magnetic and chemical variations in recording media on the nanometer scale. In particular, we characterize the grain size of a CoB-Pd multilayer media and magnetic and chemical grain sizes in perpendicular CoPtCr media
Keywords :
X-ray scattering; boron alloys; chromium alloys; cobalt alloys; core levels; grain size; magnetic multilayers; magnetic thin films; palladium; perpendicular magnetic recording; platinum alloys; CoB-Pd; CoB-Pd multilayer; CoPtCr; chemical structure; core level resonance; grain size; magnetic thin film; perpendicular recording medium; soft X-ray small-angle scattering; Chemicals; Grain size; Magnetic cores; Magnetic films; Magnetic resonance imaging; Optical imaging; Perpendicular magnetic recording; Spectroscopy; X-ray imaging; X-ray scattering;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.1017758
