• DocumentCode
    780948
  • Title

    Particle dependence of the gallium vacancy production in irradiated n-type gallium arsenide

  • Author

    Khanna, S.M. ; Jorio, A. ; Carlone, C. ; Parenteau, M. ; Houdayer, A. ; Gerdes, J.W., Jr.

  • Author_Institution
    Defence Res. Establ., Ottawa, Ont., Canada
  • Volume
    42
  • Issue
    6
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    2095
  • Lastpage
    2103
  • Abstract
    The relative introduction rate of the gallium vacancy in n-type GaAs irradiated with 60Co γ rays, 7 MeV electrons, fusion (14 MeV) and fission (1 MeV) neutrons, protons (0.6 to 200 MeV), deuterons (1 to 10 MeV), α particles (2.5 to 10 MeV), lithium (5 to 20 MeV) and oxygen ions (10 to 30 MeV) has been determined. Effects of annealing are reported. The measured introduction rates obtained with proton irradiation for energies up to 10 MeV, and for the heavy ions agree reasonably well with Rutherford scattering, NIEL calculations and the TRIM simulation. The results for electron irradiation also agree with the corresponding NIEL calculations
  • Keywords
    III-V semiconductors; alpha-particle effects; annealing; deuteron effects; electron beam effects; gallium arsenide; gamma-ray effects; ion beam effects; neutron effects; photoluminescence; proton effects; vacancies (crystal); α-particle irradiation; 0.6 to 200 MeV; 60Co γ ray irradiation; Ga vacancy production; GaAs; Li ion irradiation; NIEL calculations; O ion irradiation; Rutherford scattering; TRIM simulation; annealing effects; deuteron irradiation; electron irradiation; fission neutron irradiation; fusion neutron irradiation; heavy ion irradiation; n-type GaAs; photoluminescence; proton irradiation; radiation damage; relative introduction rate; Electrons; Energy loss; Gallium arsenide; Hall effect; III-V semiconductor materials; Neutrons; Particle production; Protons; Radiation detectors; Virtual colonoscopy;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.489258
  • Filename
    489258