DocumentCode :
781011
Title :
Patterned media made from pre-etched wafers: a promising route toward ultrahigh-density magnetic recording
Author :
Moritz, J. ; Landis, S. ; Toussaint, J.C. ; Bayle-Guillemaud, P. ; Rodmacq, B. ; Casali, G. ; Lebib, A. ; Chen, Y. ; Nozires, J.P. ; Diény, B.
Author_Institution :
SPINTEC, CEA Grenoble, France
Volume :
38
Issue :
4
fYear :
2002
fDate :
7/1/2002 12:00:00 AM
Firstpage :
1731
Lastpage :
1736
Abstract :
We have investigated a very efficient way to produce patterned media for ultrahigh density magnetic recording by first preparing patterned wafers made of silicon. Two ways of patterning the wafers were investigated: direct e-beam lithography with reactive ion etching and nanoimprinting. Features as small as 30 nm with a pitch of 60 nm were realized by nanoimprint. Subsequently, a magnetic material was deposited on these patterned wafers, covering the top of the dots, the bottom of the trenches between dots, and to a lesser extent, the sidewalls of the dots. The magnetic information is stored in the magnetic deposit located on top of the dots. In most of our studies, the deposited magnetic materials were (Co-Pt) multilayers with perpendicular magnetic anisotropy. The influence of the magnetic deposit in the trenches as well as on the sidewalls of the dots was investigated. Two techniques were developed to manipulate the information written on the dots. One is a thermomagnetic writing process which consists of locally heating a single dot by flowing a pulse of current from a conductive atomic force microscopy tip to the dot. The second writing technique consists of using standard write heads for hard disk to locally apply a magnetic field on each individual dot. This paper presents a review of our work on these arrays of dots made from prepatterned wafers
Keywords :
atomic force microscopy; cobalt; electron beam lithography; magnetic multilayers; perpendicular magnetic anisotropy; perpendicular magnetic recording; plasma materials processing; platinum; sputter etching; thermomagnetic effects; 30 nm; 60 nm; Co-Pt; Co-Pt magnetic multilayers; Si; conductive atomic force microscopy tip; current pulse; direct e-beam lithography; dot sidewalls; feature pitch; feature size; hard disk; local dot heating; local magnetic field; magnetic deposit; magnetic dots; magnetic material; nanoimprinting; patterned magnetic media; patterned media; patterned wafers; perpendicular magnetic anisotropy; pre-etched wafers; prepatterned wafers; reactive ion etching; thermomagnetic writing process; trenches; ultrahigh density magnetic recording; ultrahigh-density magnetic recording; write heads; writing technique; Atomic force microscopy; Etching; Lithography; Magnetic anisotropy; Magnetic materials; Magnetic recording; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Silicon; Writing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2002.1017764
Filename :
1017764
Link To Document :
بازگشت