DocumentCode :
781015
Title :
Low Turn-On Voltage and High-Current \\hbox {InP}/ \\hbox {In}_{0.37}\\hbox {Ga}_{0.63}\\hbox {As}_{0.89}\\hbox {Sb}_{0.11}/\\hbox {In}_{0.53}\\hbox {Ga}_{0.47}\\hbox {As} D
Author :
Chen, Shu-Han ; Teng, Kuo-Hung ; Chen, Hsin-Yuan ; Wang, Sheng-Yu ; Chyi, Jen-Inn
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli
Volume :
29
Issue :
7
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
655
Lastpage :
657
Abstract :
We report on the dc and microwave characteristics of an InP/In0.37Ga0.63As0.89Sb0.11/In0.53Ga0.47As double heterojunction bipolar transistor grown by solid-source molecular beam epitaxy. The pseudomorphic In0.37Ga0.63As0.89Sb0.11 base reduces the conduction band offset DeltaEC at the emitter/base junction and the base band gap, which leads to a very low VBE turn-on voltage of 0.35 V at 1 A/cm2. A current gain of 125 and a peak fT of 238 GHz have been obtained on the devices with an emitter size of 1times10 mum2, suggesting that a high collector average velocity and a high current capability are achieved due to the type-II lineup at the InGaAsSb/InGaAs base/collector junction.
Keywords :
III-V semiconductors; gallium arsenide; heterojunction bipolar transistors; indium compounds; molecular beam epitaxial growth; InP-In0.37Ga0.63As0.89Sb0.11-In0.53Ga0.47As; base band gap; emitter-base junction; frequency 238 GHz; solid-source molecular beam epitaxy; turn-on voltage-high-current double heterojunction bipolar transistors; voltage 0.35 V; Bipolar transistors; Double heterojunction bipolar transistors; Electron emission; Indium gallium arsenide; Indium phosphide; Low voltage; Molecular beam epitaxial growth; Photonic band gap; Spontaneous emission; Tunneling; Heterojunction bipolar transistors (HBTs); InGaAsSb; InP; Type-II;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2008.923207
Filename :
4558117
Link To Document :
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