• DocumentCode
    781016
  • Title

    Characterization of a fully resonant, 1-MHz, 25-Watt, DC/DC converter fabricated in a rad-hard BiCMOS/high-voltage process

  • Author

    Titus, J.L. ; Gehlhausen, M.A. ; Desko, J.C., Jr. ; Nguyen, T.T. ; Shibib, M.A. ; Hollenbach, K.E. ; Roberts, D.J.

  • Author_Institution
    Naval Surface Warfare Center, Crane, IN, USA
  • Volume
    42
  • Issue
    6
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    2143
  • Lastpage
    2148
  • Abstract
    This paper presents the characterization of a DC/DC converter prototype when its power integrated circuit (PIC) chip is exposed to total dose, dose rate, neutron, and heavy ion environments. This fully resonant, 1-MHz, 25-Watt, DC/DC converter is composed of a brassboard, populated with input/output filters, isolation transformers, output rectifier, capacitors, resistors, and PIC chip, integrating the primary-side control circuitry, secondary-side control circuitry, power switch, gate-drive circuitry, and voltage references. The brassboard is built using commercial off-the-shelf components; and the PIC chip is fabricated using AT&T´s rad-hard, bipolar complementary metal-oxide semiconductor (BiCMOS)/high-voltage process. The intent of this paper is to demonstrate that the PIC chip is fabricated with a radiation-hardened process and to demonstrate that various analog, digital, and power functions can be effectively integrated
  • Keywords
    BiCMOS analogue integrated circuits; DC-DC power convertors; ion beam effects; neutron effects; power integrated circuits; radiation hardening (electronics); resonant power convertors; 1 MHz; 25 W; BiCMOS/high-voltage process; PIC chip; brassboard; dose rate; fully resonant DC/DC converter; heavy ion irradiation; neutron irradiation; power integrated circuit; radiation hardness; total dose; DC-DC power converters; Filters; Neutrons; Power integrated circuits; Prototypes; RLC circuits; Resonance; Thyristors; Transformers; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.489265
  • Filename
    489265