A practical current sensing technique for I/sub DDQ/ testing

Author

Tang, Jing-Jou ; Lee, Kuen-Jong ; Liu, Bin-Da

Author_Institution

Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan

Volume

3

Issue

2

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

302

Lastpage

310

Abstract

In this paper, a practical design for built-in current sensors (BICS´s) is proposed. This scheme can execute current testing during the normal circuit operation with very small impact on the performance of the circuit under test (CUT). In addition, scalable resolutions and no external voltage/current reference make this design more effective and efficient than previous designs. Moreover this scheme can be used to monitor the current-related faults of both CMOS and non-CMOS circuits. Thus it is highly suitable for design for testability (DFT) on a multiple-chip module (MCM) or to be the current monitor on the test fixture under the quality test action group (QTAG) standard.<>

Keywords

automatic testing; built-in self test; design for testability; digital integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing; monitoring; monolithic integrated circuits; multichip modules; CMOS circuits; DFT; I/sub DDQ/ testing; MCM; QTAG standard; built-in current sensors; current monitor; current sensing technique; current-related fault monitoring; design for testability; multiple-chip module; nonCMOS circuits; quality test action group; test fixture; CMOS logic circuits; Circuit faults; Circuit testing; Degradation; Design for testability; Fixtures; Logic testing; Monitoring; Semiconductor device modeling; Voltage;

fLanguage

English

Journal_Title

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

Publisher

ieee

ISSN

1063-8210

Type

jour

DOI

10.1109/92.386229

Filename

386229