Title :
Embedded software-based self-test for programmable core-based designs
Author :
Krstic, Angela ; Lai, Wei-Cheng ; Cheng, Kwang-Ting ; Chen, Li ; Dey, Sujit
Author_Institution :
California Univ., Santa Barbara, CA, USA
Abstract :
The programmable cores on SoCs can perform on-chip test generation, measurement, response analysis, and even diagnosis. This software-based approach to self-testing enables at-speed testing and incurs low DFT overhead. We give an overview of the existing embedded software-based self-testing and self-diagnosis methods for core-based SoC designs, and we discuss the challenges to further developing this new testing paradigm
Keywords :
built-in self test; embedded systems; integrated circuit testing; logic testing; microprocessor chips; DFT overhead; core-based SoC designs; embedded software-based self-test; measurement; microprocessors; on-chip test generation; programmable core-based designs; response analysis; self-diagnosis methods; system-on-a-chip architectures; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Logic testing; Microprocessors; Software testing; System testing; System-on-a-chip;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2002.1018130
